Item
Handheld Surface Roughness Tester
Measuring Range
0 micron in to 3937 micron in, 1.97 micron in to 15748 micron in
Profile
Ra, Rq, Rt, Rz, Rc, Rmax, Rsm, Rpc, Rmr, R, Ar, Rx
Sampling Length (In.)
0.63 in
Number of Sampling Spans
1, 2, 3, 4, 5
Includes
Software CD, Adjustable Stand, Probe Cover
Cut Off Length (In.)
0.01 in, 0.03 in, 0.1 in
Tester Series
Insize S1000B
Output
USB Cable, Software
Arbitrary Length (In.)
4.800
Analysis Graph
Profile and Curve
Features
Automatic Probe Leveling
Dimensions (In.)
4.80 x 2.05 x 2.68
Measuring Condition Standards
ISO-4287, JISB0601, ISO-12085, JIS-B0631
Number of Parameters Measured
12
Data Output Connection Type
USB, Software
Measuring Range (mm)
0.4 mm
Display Functions
Two Line
Detector Measuring Force
0.83 mN
Probe Positions
90 degrees
Measuring Range Ra
0.005 micronm to 100 micronm
Measuring Range Rz
0.05 micronm to 400 micronm
Memory Storage Capacity
100
Dimensions - Display Unit
2.68 in x 2.05 in x 4.80 in
Transverse Cutoff Length
0.01 in; 0.03 in; 0.1 in
Maximum Operating Temperature - F
104 Degrees F
Measuring Range (In.)
0 micron in to 3937 micron in, 1.97 micron in to 15748 micron in
Maximum Operating Temperature - C
40 Degrees C
Parameters Measured
Ra, Rq, Rt, Rz, Rc, Rmax, Rsm, Rpc, Rmr, R, Ar, Rx
Probe Sensor Type
Inductive
Sampling Range Arbitrary Length
4.8 mm
Minimum Operating Temperature - F
-4 Degrees F
Profile Resolution
0.01micron in
Minimum Operating Temperature - C
-20 Degrees C
Operating Position
Horizontal, Vertical
Display Screen Size
2.7 in
Operating Temperature Range
-4 Degrees F to 104 Degrees F / -20 Degrees C to 40 Degrees C
Compatible Memory Card
None
Country of Origin (subject to change)
Italy
